An Advanced Ageing Methodology for Robustness Assessment of Normally-off AlGaN/GaN HEMT

التفاصيل البيبلوغرافية
العنوان: An Advanced Ageing Methodology for Robustness Assessment of Normally-off AlGaN/GaN HEMT
المؤلفون: Albany, F., Curutchet, A., Labat, N., Lecourt, F., Walasiak, E., Maher, H., Cordier, Y., Defrance, N., Malbert, N.
المصدر: 2020 15th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2020 15th European. :237-240 Jan, 2021
Relation: 2020 15th European Microwave Integrated Circuits Conference (EuMIC)
قاعدة البيانات: IEEE Xplore Digital Library