مؤتمر
An Advanced Ageing Methodology for Robustness Assessment of Normally-off AlGaN/GaN HEMT
العنوان: | An Advanced Ageing Methodology for Robustness Assessment of Normally-off AlGaN/GaN HEMT |
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المؤلفون: | Albany, F., Curutchet, A., Labat, N., Lecourt, F., Walasiak, E., Maher, H., Cordier, Y., Defrance, N., Malbert, N. |
المصدر: | 2020 15th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2020 15th European. :237-240 Jan, 2021 |
Relation: | 2020 15th European Microwave Integrated Circuits Conference (EuMIC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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