Robust design of 0.18 /spl mu/m ASIC MOSFETs using Taguchi method with TCAD

التفاصيل البيبلوغرافية
العنوان: Robust design of 0.18 /spl mu/m ASIC MOSFETs using Taguchi method with TCAD
المؤلفون: Kamohara, S., Kawakami, M., Kosaka, E., Ito, F., Okuyama, K., Ohji, Y.
المصدر: 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550) Statistical methodology Statistical Methodology, IEEE International Workshop on, 2001 6yh.. :21-24 2001
Relation: 2001 6th International Workshop on Statistical Methodology
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780366883
9780780366886
DOI:10.1109/IWSTM.2001.933818