مؤتمر
A new extraction method of device parameters for mass production E-T data analysis
| العنوان: | A new extraction method of device parameters for mass production E-T data analysis |
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| المؤلفون: | Kamohara, S., Ohuchi, T., Okuyama, K., Murakami, E., Kawashima, Y., Nishida, A., Suzuki, C., Ohji, Y., Kubota, K. |
| المصدر: | 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550) Statistical methodology Statistical Methodology, IEEE International Workshop on, 2001 6yh.. :43-46 2001 |
| Relation: | 2001 6th International Workshop on Statistical Methodology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780366883 9780780366886 |
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| DOI: | 10.1109/IWSTM.2001.933823 |