مؤتمر
Reliability of STT-MRAM for various embedded applications
| العنوان: | Reliability of STT-MRAM for various embedded applications |
|---|---|
| المؤلفون: | Han, S. H., Lee, J. H., Suh, K. S., Nam, K. T., Jeong, D. E., Oh, S. C., Hwang, S. H., Ji, Y., Lee, K., Song, Y. J., Hong, Y. G., Jeong, G. T. |
| المصدر: | 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-5 Mar, 2021 |
| Relation: | 2021 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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