التفاصيل البيبلوغرافية
العنوان: |
Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications |
المؤلفون: |
Hung, S.C., Chen, S.C., Chien, P.S., Cho, Y.S., Lee, Y.-H., Hung, W.S. |
المصدر: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021 |
Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |