مؤتمر
Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination
العنوان: | Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination |
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المؤلفون: | Zeng, Ke, Chowdhury, Srabanti, Gunning, Brendan, Kaplar, Robert, Anderson, Travis |
المصدر: | 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021 |
Relation: | 2021 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781728168937 |
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تدمد: | 19381891 |
DOI: | 10.1109/IRPS46558.2021.9405165 |