Space Radiation Effects on SiC Power Device Reliability

التفاصيل البيبلوغرافية
العنوان: Space Radiation Effects on SiC Power Device Reliability
المؤلفون: Lauenstein, Jean-Marie, Casey, Megan C., Ladbury, Ray L., Kim, Hak S., Phan, Anthony M., Topper, Alyson D.
المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728168937
تدمد:19381891
DOI:10.1109/IRPS46558.2021.9405180