مؤتمر
Analysis of Drain Current Enhancement in "PN-Body Tied SOI-FET" -Bulk vs Surface Conduction Mode and Low Vds Saturation Effect-
| العنوان: | Analysis of Drain Current Enhancement in "PN-Body Tied SOI-FET" -Bulk vs Surface Conduction Mode and Low Vds Saturation Effect- |
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| المؤلفون: | Itoh, Hiroki, Ida, Jiro, Mori, Takayuki, Ishibashi, Koichiro |
| المصدر: | 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on. :1-2 Apr, 2021 |
| Relation: | 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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