دورية أكاديمية
Influence of Within-Die Transistor Characteristics Variation on FINFET Circuit Delay
| العنوان: | Influence of Within-Die Transistor Characteristics Variation on FINFET Circuit Delay |
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| المؤلفون: | Pidin, S. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3276-3282 Jul, 2021 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2021.3082110 |