Research on Single-Event Vulnerability and Hardening for a Pipelined ADC

التفاصيل البيبلوغرافية
العنوان: Research on Single-Event Vulnerability and Hardening for a Pipelined ADC
المؤلفون: Chen, Zulin, Wang, Zongmin, Zhang, Tieliang, Yang, Long, Jin, Xiang
المصدر: 2021 4th International Conference on Circuits, Systems and Simulation (ICCSS) Circuits, Systems and Simulation (ICCSS), 2021 4th International Conference on. :148-152 May, 2021
Relation: 2021 4th International Conference on Circuits, Systems and Simulation (ICCSS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728167527
9781728167510
DOI:10.1109/ICCSS51193.2021.9464194