A Full-region Model for Ultra-Scaled MoS2 MOSFET Covering Direct Source-Drain Tunneling

التفاصيل البيبلوغرافية
العنوان: A Full-region Model for Ultra-Scaled MoS2 MOSFET Covering Direct Source-Drain Tunneling
المؤلفون: Cai, Weiran, Lan, Wenrui, Ma, Zichao, Zhang, Lining, Chan, Mansun
المصدر: 2021 9th International Symposium on Next Generation Electronics (ISNE) Next Generation Electronics (ISNE), 2021 9th International Symposium on. :1-3 Jul, 2021
Relation: 2021 9th International Symposium on Next Generation Electronics (ISNE)
قاعدة البيانات: IEEE Xplore Digital Library