Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study

التفاصيل البيبلوغرافية
العنوان:	Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study
المؤلفون:	Jay, A., Hemeryck, A., Cristiano, F., Rideau, D., Julliard, P.L., Goiffon, V., LeRoch, A., Richard, N., Samos, L. Martin, Gironcoli, S. De
المصدر:	2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :128-132 Sep, 2021
Relation:	2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
قاعدة البيانات:	IEEE Xplore Digital Library