مؤتمر
Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study
العنوان: | Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study |
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المؤلفون: | Jay, A., Hemeryck, A., Cristiano, F., Rideau, D., Julliard, P.L., Goiffon, V., LeRoch, A., Richard, N., Samos, L. Martin, Gironcoli, S. De |
المصدر: | 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :128-132 Sep, 2021 |
Relation: | 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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