دورية أكاديمية
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods
| العنوان: | CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods |
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| المؤلفون: | Hill, I., Chanawala, P., Singh, R., Sheikholeslam, S.A., Ivanov, A. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(1):1-18 Mar, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2021.3131345 |