Evaluating Common Electronic Components and GaN HEMTs Under Cryogenic Conditions

التفاصيل البيبلوغرافية
العنوان: Evaluating Common Electronic Components and GaN HEMTs Under Cryogenic Conditions
المؤلفون: Wadsworth, Aaron, Pais, Brandon, Kyle, Shaun, Thrimawithana, Duleepa J., Badcock, Rodney A., Lapthorn, Andrew, Heffernan, Bill, Oliver, Rachel A., Wallis, David J., Neuberger, Martin
المصدر: 2021 IEEE Southern Power Electronics Conference (SPEC) Power Electronics Conference (SPEC), 2021 IEEE Southern. :1-6 Dec, 2021
Relation: 2021 IEEE Southern Power Electronics Conference (SPEC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665436236
DOI:10.1109/SPEC52827.2021.9709441