التفاصيل البيبلوغرافية
| العنوان: |
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling |
| المؤلفون: |
Verreck, D., Arreghini, A., Schanovsky, F., Rzepa, G., Stanojevic, Z., Mitterbauer, F., Kernstock, C., Baumgartner, O., Karner, M., Van den bosch, G., Rosmeulen, M. |
| المصدر: |
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :1-4 Dec, 2021 |
| Relation: |
2021 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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