مؤتمر
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
| العنوان: | An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip |
|---|---|
| المؤلفون: | Angione, F., Bernardi, P., Filipponi, G., Reorda, M. Sonza, Appello, D., Tancorre, V., Ugioli, R. |
| المصدر: | 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022 |
| Relation: | 2022 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665467063 9781665467056 |
|---|---|
| تدمد: | 15581780 |
| DOI: | 10.1109/ETS54262.2022.9810396 |