مؤتمر
Thermal analysis of InGaAs/AlGaAs quantum well lasers diode by atomic force microscope (AFM)
| العنوان: | Thermal analysis of InGaAs/AlGaAs quantum well lasers diode by atomic force microscope (AFM) |
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| المؤلفون: | Weiling Guo, Tao Yin, Peng Lian, Ying Liu, Guo Gao, Deshu Zou, Guangdi Shen, Haoming Chen |
| المصدر: | 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) Solid-state and integrated circuit technology Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on. 2:1066-1069 vol.2 2001 |
| Relation: | Proceedings of 6th International Conference on Solid-State and IC Technology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780365208 9780780365209 |
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| DOI: | 10.1109/ICSICT.2001.982081 |