التفاصيل البيبلوغرافية
العنوان: |
Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling |
المؤلفون: |
Choe, Gihun, Ravindran, Prasanna Venkatesan, Lu, Anni, Hur, Jae, Lederer, Maximilian, Reck, Andre, Lombardo, Sarah, Afroze, Nashrah, Kacher, Josh, Khan, Asif Islam, Yu, Shimeng |
المصدر: |
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :336-337 Jun, 2022 |
Relation: |
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) |
قاعدة البيانات: |
IEEE Xplore Digital Library |