مؤتمر
Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling
| العنوان: | Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling |
|---|---|
| المؤلفون: | Choe, Gihun, Ravindran, Prasanna Venkatesan, Lu, Anni, Hur, Jae, Lederer, Maximilian, Reck, Andre, Lombardo, Sarah, Afroze, Nashrah, Kacher, Josh, Khan, Asif Islam, Yu, Shimeng |
| المصدر: | 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :336-337 Jun, 2022 |
| Relation: | 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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