مؤتمر
Automatic 4 K Cryogenic Probe Station for DC and Microwave Measurements on 150-mm and 200-mm Wafers
العنوان: | Automatic 4 K Cryogenic Probe Station for DC and Microwave Measurements on 150-mm and 200-mm Wafers |
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المؤلفون: | West, Joshua T., Kurlej, Arthur, Wynn, Alex, Rogers, Chad, Gouker, Mark A., Tolpygo, Sergey K. |
المصدر: | 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 International Microwave Symposium - IMS 2022, 2022 IEEE/MTT-S. :237-240 Jun, 2022 |
Relation: | 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 |
قاعدة البيانات: | IEEE Xplore Digital Library |
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