التفاصيل البيبلوغرافية
| العنوان: |
Embedded measurement of the SET switching time of RRAM memory cells |
| المؤلفون: |
Jebali, F., Muhr, E., Alayan, M., Faye, M.C., Querlioz, D., Andrieu, F., Vianello, E., Molas, G., Bocquet, M., Portal, J.M. |
| المصدر: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-5 Mar, 2022 |
| Relation: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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