مؤتمر
A Comparison of Ion Implantation at Room Temperature and Heated Ion Implantation on the Body Diode Degradation of Commercial 3.3 kV 4H-SiC Power MOSFETs
| العنوان: | A Comparison of Ion Implantation at Room Temperature and Heated Ion Implantation on the Body Diode Degradation of Commercial 3.3 kV 4H-SiC Power MOSFETs |
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| المؤلفون: | Qian, Jiashu, Liu, Tianshi, Soto, Jake, Al-Jassim, Mowafak M., Stahlbush, Robert, Mahadik, Nadeemullah, Shi, Limeng, Jin, Michael, Agarwal, Anant K. |
| المصدر: | 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) Wide Bandgap Power Devices & Applications (WiPDA), 2022 IEEE 9th Workshop on. :49-53 Nov, 2022 |
| Relation: | 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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