التفاصيل البيبلوغرافية
| العنوان: |
A Comparison of Short-Circuit Failure Mechanisms of 1.2 kV 4H-SiC MOSFETs and JBSFETs |
| المؤلفون: |
Kim, Dongyoung, DeBoer, Skylar, Jang, Seung Yup, Morgan, Adam J., Sung, Woongje |
| المصدر: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) Wide Bandgap Power Devices & Applications (WiPDA), 2022 IEEE 9th Workshop on. :54-57 Nov, 2022 |
| Relation: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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