مؤتمر
Statistical methods for the determination of process corners
العنوان: | Statistical methods for the determination of process corners |
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المؤلفون: | Kocher, M., Rappitsch, G. |
المصدر: | Proceedings International Symposium on Quality Electronic Design Quality electronic design Quality Electronic Design, 2002. Proceedings. International Symposium on. :133-137 2002 |
Relation: | Proceedings of the 2002 3rd International Symposium on Quality Electronic Design |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0769515614 9780769515618 |
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DOI: | 10.1109/ISQED.2002.996713 |