التفاصيل البيبلوغرافية
| العنوان: |
WLCSP Descum Process Criticality and its Impact on Leakage Performance |
| المؤلفون: |
Beng, Lau Teck, Fu, Chofu Liu Yu, Choi, Yujun, Swartjes, Frank, Lim, Myungjin, Oh, Won Seok, Shin, Martin |
| المصدر: |
2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT) Electronics Manufacturing Technology Conference (IEMT), 2022 IEEE 39th International. :1-5 Oct, 2022 |
| Relation: |
2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
