مؤتمر
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
العنوان: | High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST |
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المؤلفون: | Sato, Keno, Nakatani, Takayuki, Katayama, Shogo, Iimori, Daisuke, Ogihara, Gaku, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Katoh, Kentaroh, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo |
المصدر: | 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :37-42 Nov, 2022 |
Relation: | 2022 IEEE 31st Asian Test Symposium (ATS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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