دورية أكاديمية
Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
| العنوان: | Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET |
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| المؤلفون: | Alberton, Saulo G., Aguiar, V.A.P., Medina, N.H., Added, N., Macchione, E.L.A., Menegasso, R., Cesário, G.J., Santos, H.C., Scarduelli, V.B., Alcántara-Núñez, J.A., Guazzelli, M.A., Santos, R.B.B., Flechas, D. |
| المصدر: | In Microelectronics Reliability October 2022 137 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/j.microrel.2022.114784 |