دورية أكاديمية
Noise and reliability measurement of a three-axis micro-accelerometer
| العنوان: | Noise and reliability measurement of a three-axis micro-accelerometer |
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| المؤلفون: | Mohd-Yasin, F., Zaiyadi, N., Nagel, D.J., Ong, D.S., Korman, C.E., Faidz, A.R. |
| المصدر: | In Microelectronic Engineering 2009 86(4):991-995 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 01679317 |
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| DOI: | 10.1016/j.mee.2008.12.045 |