دورية أكاديمية
Digital image correlation of SEM images for surface deformation of CMOS IC
العنوان: | Digital image correlation of SEM images for surface deformation of CMOS IC |
---|---|
المؤلفون: | Chen, Terry Yuan-Fang, Chen, Tzu-Ching, Cheng, Fa-Yen, Tsai, Ang-Ting, Lin, Ming-Tzer |
المصدر: | In Microelectronic Engineering 5 December 2018 201:16-21 |
قاعدة البيانات: | ScienceDirect |
تدمد: | 01679317 |
---|---|
DOI: | 10.1016/j.mee.2018.09.007 |