دورية أكاديمية
Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range
| العنوان: | Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range |
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| المؤلفون: | Aruev, P.N., Kolokolnikov, Yu.M., Kovalenko, N.V., Legkodymov, A.A., Lyakh, V.V., Nikolenko, A.D., Pindyurin, V.F., Sukhanov, V.L., Zabrodsky, V.V. |
| المصدر: | In Nuclear Inst. and Methods in Physics Research, A 2009 603(1):58-61 |
| قاعدة البيانات: | ScienceDirect |
Full Text Finder | تدمد: | 01689002 |
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| DOI: | 10.1016/j.nima.2008.12.159 |