دورية أكاديمية

Relaxed SiGe-on-insulator with high Ge fraction obtained by oxidation of SiGe/Si-on-insulator with hydrogen ions implantation

التفاصيل البيبلوغرافية
العنوان: Relaxed SiGe-on-insulator with high Ge fraction obtained by oxidation of SiGe/Si-on-insulator with hydrogen ions implantation
المؤلفون: Cheng, Xinli, Liu, Hong, Zhang, Feng
المصدر: In Applied Surface Science 15 March 2007 253(10):4472-4476
قاعدة البيانات: ScienceDirect
الوصف
تدمد:01694332
DOI:10.1016/j.apsusc.2006.09.057