دورية أكاديمية
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
| العنوان: | Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography |
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| المؤلفون: | Anna Bieber, author1, Cristina Capitanio, author1, Florian Wilfling, author1, 2, Jürgen Plitzko, author1, Philipp S. Erdmann, author1, 3 |
| المصدر: | Journal of Visualized Experiments. (176) |
| الإتاحة: | http://www.jove.com/video/62886 |
| قاعدة البيانات: | JoVE Journal |
| تدمد: | 1940087X |
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| DOI: | 10.3791/62886 |