كتاب إلكتروني
Texture analysis of silicide thin films: combining statistical and microscopical information
| العنوان: | Texture analysis of silicide thin films: combining statistical and microscopical information |
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| المؤلفون: | Schletter, H.Aff2, Schulze, S.Aff2, Hietschold, M.Aff2, De Keyser, K.Aff3, Detavernier, C.Aff3, Beddies, G.Aff2, Bleloch, A.Aff4, Falke, M.Aff2 |
| المساهمون: | Richter, Silvia, editorAff1, Schwedt, Alexander, editorAff1 |
| المصدر: | EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 2: Materials Science. :365-366 |
| قاعدة البيانات: | Springer Nature eBooks |
Full Text Finder | ردمك: | 9783540852254 9783540852261 |
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| DOI: | 10.1007/978-3-540-85226-1_183 |