دورية أكاديمية
A lot inspection sampling plan based on EWMA yield index
| العنوان: | A lot inspection sampling plan based on EWMA yield index |
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| المؤلفون: | Yen, Ching-Ho, Aslam, Muhammad, Jun, Chi-Hyuck |
| المصدر: | The International Journal of Advanced Manufacturing Technology. November 2014 75(5-8):861-868 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 02683768 14333015 |
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| DOI: | 10.1007/s00170-014-6174-z |