دورية أكاديمية
Exploring the potential of deep learning and machine learning techniques for randomness analysis to enhance security on IoT
| العنوان: | Exploring the potential of deep learning and machine learning techniques for randomness analysis to enhance security on IoT |
|---|---|
| المؤلفون: | Ince, KenanAff1, IDs1020702300783y_cor1 |
| المصدر: | International Journal of Information Security. 23(2):1117-1130 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 16155262 16155270 |
|---|---|
| DOI: | 10.1007/s10207-023-00783-y |