دورية أكاديمية
Synchrotron white beam x-ray topography analysis of MBE grown CdTe/CdTe (111)B
| العنوان: | Synchrotron white beam x-ray topography analysis of MBE grown CdTe/CdTe (111)B |
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| المؤلفون: | Fanning, T., Lee, M. B., Casagrande, L. G., Di Marzio, D., Dudley, M. |
| المصدر: | Journal of Electronic Materials. August 1993 22(8):943-949 |
| قاعدة البيانات: | Springer Nature Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 03615235 1543186X |
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| DOI: | 10.1007/bf02817508 |