دورية أكاديمية
High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique.
| العنوان: | High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique. |
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| المؤلفون: | Sier D; School of Physics, University of Melbourne, Australia., Cousland GP; School of Physics, University of Melbourne, Australia., Trevorah RM; School of Physics, University of Melbourne, Australia., Ekanayake RSK; School of Physics, University of Melbourne, Australia., Tran CQ; La Trobe University, Australia., Hester JR; Australian Nuclear Science and Technology Organisation, Menai, Australia., Chantler CT; School of Physics, University of Melbourne, Australia. |
| المصدر: | Journal of synchrotron radiation [J Synchrotron Radiat] 2020 Sep 01; Vol. 27 (Pt 5), pp. 1262-1277. Date of Electronic Publication: 2020 Aug 17. |
| نوع المنشور: | Journal Article |
| اللغة: | English |
| بيانات الدورية: | Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9888878 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1600-5775 (Electronic) Linking ISSN: 09090495 NLM ISO Abbreviation: J Synchrotron Radiat Subsets: PubMed not MEDLINE; MEDLINE |
| أسماء مطبوعة: | Publication: [Malden, MA] : Wiley Online Library Original Publication: Copenhagen : Wiley-Blackwell Munksgaard, c1994- |
| مستخلص: | Measurements of mass attenuation coefficients and X-ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X-ray extended range technique, a relatively new methodology, which can be set up on most synchrotron X-ray beamlines. 561 attenuation coefficients were recorded in the energy range 6.8-15 keV with measurements concentrated at the zinc and selenium pre-edge, near-edge and fine-structure absorption edge regions. This accuracy yielded detailed nanostructural analysis of room-temperature ZnSe with full uncertainty propagation. Bond lengths, accurate to 0.003 Å to 0.009 Å, or 0.1% to 0.3%, are plausible and physical. Small variation from a crystalline structure suggests local dynamic motion beyond that of a standard crystal lattice, noting that XAFS is sensitive to dynamic correlated motion. The results obtained in this work are the most accurate to date with comparisons with theoretically determined values of the attenuation showing discrepancies from literature theory of up to 4%, motivating further investigation into the origin of such discrepancies. |
| فهرسة مساهمة: | Keywords: 0.1% accuracy; K-edges; XAFS; XERT; ZnSe |
| تواريخ الأحداث: | Date Created: 20200903 Latest Revision: 20200903 |
| رمز التحديث: | 20221213 |
| DOI: | 10.1107/S1600577520010097 |
| PMID: | 32876602 |
| قاعدة البيانات: | MEDLINE |
Full Text Finder | تدمد: | 1600-5775 |
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| DOI: | 10.1107/S1600577520010097 |