دورية أكاديمية

A Novel Apparatus to Standardise the Polishing Protocol to Achieve Different Roughness of Titanium and Zirconia Disc Surfaces.

التفاصيل البيبلوغرافية
العنوان: A Novel Apparatus to Standardise the Polishing Protocol to Achieve Different Roughness of Titanium and Zirconia Disc Surfaces.
المؤلفون: Elangovan G, Ipe D, Reher P, Figueredo CM, Cameron A
المصدر: The International journal of prosthodontics [Int J Prosthodont] 2023 Sep 20; Vol. 0 (0), pp. 0. Date of Electronic Publication: 2023 Sep 20.
Publication Model: Ahead of Print
نوع المنشور: Journal Article
اللغة: English
بيانات الدورية: Publisher: Quintessence Pub. Co Country of Publication: United States NLM ID: 8900938 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1942-4426 (Electronic) Linking ISSN: 08932174 NLM ISO Abbreviation: Int J Prosthodont
أسماء مطبوعة: Original Publication: [Lombard, Ill. : Quintessence Pub. Co., c1988-
مستخلص: Purpose: This study aimed to propose and evaluate standardised polishing protocols for in vitro experiment using a custom-made apparatus under controlled force to create consistent surface roughness on titanium and zirconia disks.
Methods: A total of 160 discs were manufactured with a diameter of 10mm, 80 titanium (Ti), and 80 zirconium oxide (Zr). Specimens were categorised into 2 groups: controlled force (CF) and without controlled force (WCF). Specimens in the CF group were polished with a custom apparatus incorporating a tension gauge on the Ti and Zr disc surfaces to achieve consistent roughness. The WCF was polished without the use of a tension gauge. Each group had 4 subgroups (10 disks in each): control/machined (C) with no polishing, rough (R), smooth (S) and very smooth (VS). The subgroups were processed using a sequence of diamond-impregnated polishing burs and polishing paste.
Results: CF group showed consistent surface roughness and a gradual decrease in surface roughness. Control (Ra=6.5±0.03µm) in Ti and (Ra=5.4±0.04µm) in Zr; R (Ra=3.5± 0.06µm) in Ti and (Ra=3.2± 0.07 µm) in Zr; S (Ra=1.5±0.04µm) in Ti and (Ra=1.1±006µm) in Zr; VS (Ra=0.05± 0.002µm) in Ti and (Ra=0.02±0.005µm) in Zr. There were significant differences for R, S, and SV under CF and WCF in Ti and Zr surfaces.
Conclusion: The specimens polished under control force produced significantly more uniform surface roughness than those polished without controlled force and were produced with a higher degree of consistency.
تواريخ الأحداث: Date Created: 20230920 Latest Revision: 20230920
رمز التحديث: 20231215
DOI: 10.11607/ijp.8430
PMID: 37729483
قاعدة البيانات: MEDLINE
الوصف
تدمد:1942-4426
DOI:10.11607/ijp.8430