دورية أكاديمية

Temperature-dependent fine structure splitting in InGaN quantum dots.

التفاصيل البيبلوغرافية
العنوان: Temperature-dependent fine structure splitting in InGaN quantum dots.
المؤلفون: Tong Wang, Puchtler, Tim J., Tongtong Zhu, Jarman, John C., Kocher, Claudius C., Oliver, Rachel A., Taylor, Robert A.
المصدر: Applied Physics Letters; 7/26/2017, Vol. 111 Issue 5, p1-5, 5p
مصطلحات موضوعية: QUANTUM dots, QUANTUM electronics, SEMICONDUCTORS, INDIUM gallium nitride, GALLIUM nitride
مستخلص: We report the experimental observation of temperature-dependent fine structure splitting in semiconductor quantum dots using a non-polar (11-20) a-plane InGaN system, up to the on-chip Peltier cooling threshold of 200 K. At 5K, a statistical average splitting of 443 ± 132 μeV has been found based on 81 quantum dots. The degree of fine structure splitting stays relatively constant for temperatures less than 100K and only increases above that temperature. At 200 K, we find that the fine structure splitting ranges between 2 and 12 meV, which is an order of magnitude higher than that at low temperatures. Our investigations also show that phonon interactions at high temperatures might have a correlation with the degree of exchange interactions. The large fine structure splitting at 200K makes it easier to isolate the individual components of the polarized emission spectrally, increasing the effective degree of polarization for potential on-chip applications of polarized single-photon sources. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:00036951
DOI:10.1063/1.4996861