مؤتمر
Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry.
العنوان: | Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry. |
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المؤلفون: | Duparré, Angela, Notni, Gunther |
المصدر: | Proceedings of SPIE; 3/11/2017, Vol. 10294, p213-231, 19p |
قاعدة البيانات: | Complementary Index |
تدمد: | 0277786X |
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DOI: | 10.1117/12.351662 |