مؤتمر
Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry.
| العنوان: | Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry. |
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| المؤلفون: | Duparré, Angela, Notni, Gunther |
| المصدر: | Proceedings of SPIE; 3/11/2017, Vol. 10294, p213-231, 19p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 0277786X |
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| DOI: | 10.1117/12.351662 |