مؤتمر
Extensive microstructural quality control inside a machine tool using multiwavelength digital holography.
| العنوان: | Extensive microstructural quality control inside a machine tool using multiwavelength digital holography. |
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| المؤلفون: | Seyler, T., Fratz, M., Beckmann, T., Bertz, A., Carl, D., Grün, V., Börret, R., Ströer, F., Seewig, J. |
| المصدر: | Proceedings of SPIE; 9/19/2018, Vol. 10834, p108342B-1-108342B-13, 13p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 0277786X |
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| DOI: | 10.1117/12.2319750 |