Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy.

التفاصيل البيبلوغرافية
العنوان:	Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy.
المؤلفون:	Nunney, Tim, Mack, Paul, Simpson, Robin, Passey, Rick, Oppong-Mensah, Helen, Baker, Mark
المصدر:	Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p1016-1016, 1p
قاعدة البيانات:	Complementary Index

الوصف
تدمد:	14319276
DOI:	10.1017/S1431927620016670