مؤتمر
Design-technology co-optimization for reliability and quality in advanced nodes.
| العنوان: | Design-technology co-optimization for reliability and quality in advanced nodes. |
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| المؤلفون: | Yuan, Chi-Min, Kim, Ryoung-Han, Shroff, Mehul D., Loke, Alvin L. S. |
| المصدر: | Proceedings of SPIE; 11/7/2020, Vol. 11614, p1161403-1161403, 1p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 0277786X |
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| DOI: | 10.1117/12.2585220 |