مؤتمر
Scanning tunneling microscopy analysis of ultrafast laser damage of single crystal silicon.
العنوان: | Scanning tunneling microscopy analysis of ultrafast laser damage of single crystal silicon. |
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المؤلفون: | Clink, Liam, Li, Zhihan, Kuz, Conrad, Gupta, Jay, Chowdhury, Enam |
المصدر: | Proceedings of SPIE; 9/25/2022, Vol. 12300, p1230005-1230005, 1p |
قاعدة البيانات: | Complementary Index |
تدمد: | 0277786X |
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DOI: | 10.1117/12.2637432 |