مؤتمر
Scanning tunneling microscopy analysis of ultrafast laser damage of single crystal silicon.
| العنوان: | Scanning tunneling microscopy analysis of ultrafast laser damage of single crystal silicon. |
|---|---|
| المؤلفون: | Clink, Liam, Li, Zhihan, Kuz, Conrad, Gupta, Jay, Chowdhury, Enam |
| المصدر: | Proceedings of SPIE; 9/25/2022, Vol. 12300, p1230005-1230005, 1p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 0277786X |
|---|---|
| DOI: | 10.1117/12.2637432 |