دورية أكاديمية
Field emission characterization of nanoFEAs on single crystal CeB6 surface fabricated by focused ion beam milling.
| العنوان: | Field emission characterization of nanoFEAs on single crystal CeB |
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| المؤلفون: | Liu, Hongliang, Guo, Zhiying, Yuan, Xiaofeng, Zhu, Zunwei, Gao, Qianqian, Zhang, Xin |
| المصدر: | Functional Materials Letters; Jan2023, Vol. 16 Issue 1, p1-5, 5p |
| مصطلحات موضوعية: | FOCUSED ion beams, SINGLE crystals, FIELD emission, ION beams, CRYSTAL surfaces, QUANTUM tunneling, SINGLE crystal testing |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 17936047 |
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| DOI: | 10.1142/S1793604723500030 |