دورية أكاديمية

Light Beam Transformation and Material Diagnostics by Dynamic Holography Methods.

التفاصيل البيبلوغرافية
العنوان: Light Beam Transformation and Material Diagnostics by Dynamic Holography Methods.
المؤلفون: Tolstik, A. L., Ivakin, E. V., Dadenkov, I. G.
المصدر: Journal of Applied Spectroscopy; May2023, Vol. 90 Issue 2, p407-413, 7p
مصطلحات موضوعية: THERMAL diffusivity, ACTIVE medium, FREQUENCY changers, HOLOGRAPHY, ELECTRON holography, EXCITED state energies, SEMICONDUCTOR materials, THIN films
مستخلص: Experimental results on frequency conversion of images by dynamic holograms and diagnostics of semiconductor materials and photorefractive and activated crystals based on the transient gratings method are presented. The possibility of visualization of infrared 3D images in real time is shown. Spectral regularities of short- (hundreds of microseconds) and long-lived (seconds) lattice recordings in photorefractive bismuth silicate crystals are established. The diffusion coefficient of excitation energy and the lifetime of excited states are measured. Techniques for compensation of induced anisotropy in active laser media and measurement of the thermal diffusivity coefficient of thin films and bulk thermoelectrics based on lead telluride are proposed. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:00219037
DOI:10.1007/s10812-023-01547-1