التفاصيل البيبلوغرافية
| العنوان: |
Pt and Pd Nanoparticle Crystallization in the Sol-Gel-Derived Thin SiO 2 Films. |
| المؤلفون: |
Gubanova, Nadezhda, Matveev, Vasilii, Grebenshchikova, Elena, Kirilenko, Demid, Sazonova, Yana, Shilova, Olga |
| المصدر: |
Physchem; Jun2023, Vol. 3 Issue 2, p259-269, 11p |
| مصطلحات موضوعية: |
PLATINUM nanoparticles, NANOPARTICLE size, X-ray reflectometry, SPIN coating, X-ray diffraction |
| مستخلص: |
The crystallization and distribution the features of Pt, Pd and Pt/Pd nanoparticles in spin-on glass SiO2 films were studied within a wide range of the dopant concentrations in silica sol (from 10 to 80 mol.% Pt, Pd or Pt/Pd per 100 mol.% Si). The grazing incidence X-ray diffraction (GIXRD) characterization revealed that the formation of 4–8 nm sized crystalline Pt, Pd and Pt/Pd nanoparticles in SiO2 films began at the dopant concentrations of at least 10 mol.% Pt and/or Pd per 100 mol.% Si. The nanoparticles obtained from sols with the lower Pt, Pd or Pt/Pd concentrations were characterized by an amorphous structure. The dopants distribution over the film thickness (~21–47 nm) was studied using X-ray reflectometry. The effect of the dopant concentration, spin-coating modes and heat treatment temperature on the film thickness was characterized. When only one of the dopants (Pt or Pd) was introduced into the silica sol, the resulting nanoparticles were preferentially localized close to the film surface. When dopants were used together, the Pt/Pd nanoparticles were distributed more evenly. [ABSTRACT FROM AUTHOR] |
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