دورية أكاديمية

Half-Lives and Intensities of X-ray and γ-Ray Emission of 113Sn, 117mSn, and 119mSn.

التفاصيل البيبلوغرافية
العنوان: Half-Lives and Intensities of X-ray and γ-Ray Emission of 113Sn, 117mSn, and 119mSn.
المؤلفون: Popov, Yu. S., Zakharova, L. V., Kupriyanov, V. N., Andreev, O. I., Vakhetov, V. Z., Toporov, Yu. G.
المصدر: Radiochemistry; Nov/Dec2003, Vol. 45 Issue 6, p537-541, 5p
مصطلحات موضوعية: ATOMS, X-rays, ELECTRON emission, RADIATION, RADIOGRAPHY, RESEARCH
مستخلص: The nuclear-physical properties of 113Sn, 117mSn, and 119mSn were studied by semiconductor X-ray and γ-ray spectrometry. The following energies (keV) and intensities (rel. units, in parentheses) of X-ray and γ-emission were obtained. 113Sn: 255 (3.2), 392 (100); 117mSn: 156 [2.4(1)], 158 (100); 119mSn: 23.8 [71.6(15)], KX 25 (100), intensity ratio 0.716(15). The KαKβ ratios for 113Sn, 117mSn, and 119mSn are 4.5(1), 4.6(2), and 4.4(2), and the half-lives T1/2 of these nuclides (days) are 115±1, 13.98±0.07, and 285±9, respectively (the errors are given for the confidence level of 0.95). The results are compared to the published data. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:10663622
DOI:10.1023/B:RACH.0000015746.20441.ad