التفاصيل البيبلوغرافية
| العنوان: |
Investigation of the structural and optical properties of (CdxZn1-xS) thin films deposited by using thermal evaporation technique. |
| المؤلفون: |
Hanash, Haider S., Hussain, Saleem A. |
| المصدر: |
AIP Conference Proceedings; 2023, Vol. 2845 Issue 1, p1-8, 8p |
| مصطلحات موضوعية: |
THIN films, OPTICAL properties, OPTICAL films, BAND gaps, REFRACTIVE index |
| مستخلص: |
The films of (CdxZn1-xS) were prepared by method of thermal evaporation under vacuum, glass substrates were used to deposit the films on them with different impurity ratios. The structural properties were determined using the X-ray diffraction, where the results obtained from the prepared films showed that they are polycrystalline, and there is one peak that is dominant in all impurity ratios, that is the films have a favorable direction of growth with the plane (111), and the grain size increases and crystal micro-strain decreases with increasing impurity ratio. As for the optical parameters of the films (CdxZn1-xS) were reached by adopting the spectrum technique (UV-Visible) and the results proved that the optical energy gap increases with the increase in the values of (x), its value has changed between (3.26,3.36,4.24) eV at the percentage of impurity (x=2.5%,5%,7.5%)w% respectively. As for the transmission, it increased with the increase in the values of (x), while the refractive index decreased with the increase in the value of (x). [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |
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